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New Reduced price! SAE J2052_201607 View larger

SAE J2052_201607

M00000224

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SAE J2052_201607 Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

standard by SAE International, 07/12/2016

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$36.55

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Full Description

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.