Full Description

ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.

Product Details

Published: 08/15/2005 File Size: 1 file , 330 KB Same As: BS ISO 18116:2005, BS ISO 18116:2005