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BS 10/30232073 DC
M00000311
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BS 10/30232073 DC BS EN 62047-14. Semiconductor devices. Micro-electromechanical systems. Part 14. Forming limit measuring method of metallic film materials
standard by BSI Group, 07/19/2010
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Cross References:
ISO 12004-1:2008
ISO 12004-2:2008
IEC 62047-1
All current amendments available at time of purchase are included with the purchase of this document.