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BS 10/30212265 DC
M00000177
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BS 10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
standard by BSI Group, 09/10/2010
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Cross References:
ISO 18116
ISO/TR 18392
All current amendments available at time of purchase are included with the purchase of this document.