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BS 11/30230316 DC
M00000608
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BS 11/30230316 DC BS EN 62047-18. Semiconductor devices. Micro-electromechanical systems. Part 18. Bending test methods of thin film materials
standard by BSI Group, 02/21/2011
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Cross References:
IEC 62047-2:2006
IEC 62047-2:2006
IEC 62047-6:2009
All current amendments available at time of purchase are included with the purchase of this document.