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BS 11/30231583 DC
M00000504
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BS 11/30231583 DC BS EN 62047-17. Semiconductor devices. Micro-electromechanical devices Part 17. Bulge test method for measuring mechanical properties of thin films
standard by BSI Group, 03/08/2011
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Cross References:
IEC 62047-2:2006
All current amendments available at time of purchase are included with the purchase of this document.