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BS 12/30235353 DC
M00000543
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BS 12/30235353 DC BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
standard by BSI Group, 01/30/2012
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All current amendments available at time of purchase are included with the purchase of this document.