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BS 07/30171395 DC
M00000021
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BS 07/30171395 DC BS EN 62374-1. Semiconductor devices. Part 1. Time dependent dielectric breakdown test (TDDB)for inter-metal layers
standard by BSI Group, 11/19/2007
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Cross References:
IEC-60747
All current amendments available at time of purchase are included with the purchase of this document.