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BS 05/30135664 DC
M00000128
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BS 05/30135664 DC IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method of components for handheld electronic products
standard by BSI Group, 06/30/2005
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Cross References:
IEC 60749-10
IEC 60749-20
IEC 60749-20-1
All current amendments available at time of purchase are included with the purchase of this document.