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BS 08/30172398 DC
M00000212
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BS 08/30172398 DC BS EN 62047-8. Semiconductor devices. Micro- electromechanical devices. Part 8. Strip bending test method for tensile property measurement of thin films
standard by BSI Group, 02/18/2008
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Cross References:
IEC 62047-1:2005
IEC 62047-2:2006
IEC 62047-3:2006
ISO 6892:1998
ISO 15490:2000