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BS 09/30190356 DC
M00000379
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BS 09/30190356 DC BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge
standard by BSI Group, 03/24/2009
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Cross References:
IEC 60749-10
IEC 60749-20
IEC 60749-20-1
IEC 60749-37
All current amendments available at time of purchase are included with the purchase of this document.