Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Reduced price! 
View larger
View larger 
ASTM E1127-08
M00011471
New product
ASTM E1127-08 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
standard by ASTM International, 10/01/2008
In stock
More info
Full Description
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.
1.2 Guidelines are given for depth profiling by the following:
| Section | |
| Ion Sputtering | 6 |
| Angle Lapping and Cross-Sectioning | 7 |
| Mechanical Cratering | 8 |
| Mesh Replica Method | 9 |
| Nondestructive Depth Profiling | 10 |
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.