Could I help you?
New Reduced price! ASTM E2444-11e1 View larger

ASTM E2444-11e1

M00008735

New product

ASTM E2444-11e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films

standard by ASTM International, 10/15/2011

More details

In stock

$21.50

-57%

$50.00

More info

Full Description

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.