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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Book DOI:10.1049/PBCS019E
Chapter DOI:10.1049/PBCS019E
ISBN: 9780863417450
e-ISBN: 9780863419997
Page count: 416
Format: PDF