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IEC 62490-1 Ed. 1.0 b:2010ESL measuring method - Part 1: Capacitors with lead terminal for use in electronic equipmentstandard by International Electrotechnical Commission, 07/28/2010
IEC 62486 Ed. 1.0 b:2010 [ Withdrawn ]Railway applications - Current collection systems - Technical criteria for the interaction between pantograph and overhead line (to achieve free access)standard by International Electrotechnical Commission, 07/28/2010
IEC 61591 Amd.2 Ed. 1.0 en:2010 [ Withdrawn ]Amendment 2 - Household range hoods and other cooking fume extractors - Methods for measuring performanceAmendment by International Electrotechnical Commission, 07/28/2010
IEC 60335-1 Ed. 5.0 b CORR1:2010Corrigendum 1 - Household and similar electrical appliances - Safety - Part 1: General requirementsCorrigenda by International Electrotechnical Commission, 07/28/2010
IEC 60191-6-18 Ed. 1.0 b CORR2:2010Corrigendum 2 - Mechanical standardization of semiconductor devices - Part 6-18: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for ball grid array (BGA)Corrigenda by International Electrotechnical...
IEC 61158-3-12 Ed. 2.0 b:2010Industrial communication networks - Fieldbus specifications - Part 3-12: Data-link layer service definition - Type 12 elementsstandard by International Electrotechnical Commission, 07/28/2010
IEC 61158-3-12 Ed. 2.0 en:2010Industrial communication networks - Fieldbus specifications - Part 3-12: Data-link layer service definition - Type 12 elementsstandard by International Electrotechnical Commission, 07/28/2010
IEC 60770-1 Ed. 2.0 b:2010 [ Withdrawn ]Transmitters for use in industrial-process control systems - Part 1: Methods for performance evaluationstandard by International Electrotechnical Commission, 07/28/2010
IEC 60749-32 Amd.1 Ed. 1.0 b:2010Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)Amendment by International Electrotechnical Commission, 07/28/2010
IEC 60749-19 Amd.1 Ed. 1.0 b:2010Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strengthAmendment by International Electrotechnical Commission, 07/28/2010
IEC 61918 Ed. 2.0 b:2010Industrial communication networks - Installation of communication networks in industrial premisesstandard by International Electrotechnical Commission, 07/22/2010
IEC 62614 Ed. 1.0 b:2010 [ Withdrawn ]Fibre optics - Launch condition requirements for measuring multimode attenuationstandard by International Electrotechnical Commission, 07/22/2010