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AS 1678.4.2.001-1980
AS 1678.4.2.001-1980...
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AS 1627.10-1980
AS 1627.10-1980...
IEC There are 14059 products.
IEC 60598-2-20 Amd.2 Ed. 2.0 b:2002
IEC 60598-2-20 Amd.2 Ed. 2.0 b:2002 [ Withdrawn ]Amendment 2 - Luminaires Part 2: Particular requirements Section 20 : Lighting chainsAmendment by International Electrotechnical Commission, 04/30/2002
$15.48 $36.00 -57%Reduced price!In stockIEC 60364-5-53 Amd.1 Ed. 3.0 b:2002
IEC 60364-5-53 Amd.1 Ed. 3.0 b:2002 [ Withdrawn ]Amendment 1 - Electrical installations of buildings - Part 5-53: Selection and erection of electrical equipment - Isolation, switching and controlAmendment by International Electrotechnical Commission, 04/30/2002
$35.26 $82.00 -57%Reduced price!In stockIEC 60353 Amd.1 Ed. 2.0 b:2002
IEC 60353 Amd.1 Ed. 2.0 b:2002Amendment 1 - Line traps for a.c. power systemsAmendment by International Electrotechnical Commission, 04/30/2002
$20.21 $47.00 -57%Reduced price!In stockIEC 60936-3 Ed. 1.0 en:2002
IEC 60936-3 Ed. 1.0 en:2002 [ Withdrawn ]Maritime navigation and radiocommunication equipment and systems - Radar - Part 3: Radar with chart facilities - Performance requirements - Methods of testing and required test resultsstandard by International Electrotechnical Commission, 04/29/2002
$35.26 $82.00 -57%Reduced price!In stockIEC 61577-3 Ed. 1.0 b:2002
IEC 61577-3 Ed. 1.0 b:2002 [ Withdrawn ]Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 3: Specific requirements for radon decay product measuring instrumentsstandard by International Electrotechnical Commission, 04/12/2002
$62.78 $146.00 -57%Reduced price!In stockIEC 60749-11 Ed. 1.0 b:2002
IEC 60749-11 Ed. 1.0 b:2002Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath methodstandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-9 Ed. 1.0 b:2002
IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of markingstandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-6 Ed. 1.0 b:2002
IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperaturestandard by International Electrotechnical Commission, 04/12/2002
$5.16 $12.00 -57%Reduced price!In stockIEC 60749-4 Ed. 1.0 b:2002
IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)standard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-2 Ed. 1.0 b:2002
IEC 60749-2 Ed. 1.0 b:2002Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressurestandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60749-13 Ed. 1.0 b:2002
IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmospherestandard by International Electrotechnical Commission, 04/12/2002
$9.89 $23.00 -57%Reduced price!In stockIEC 60870-6-503 Ed. 2.0 en:2002
IEC 60870-6-503 Ed. 2.0 en:2002 [ Withdrawn ]Telecontrol equipment and systems - Part 6-503: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - TASE.2 Services and protocolstandard by International Electrotechnical...
$166.41 $387.00 -57%Reduced price!In stock
