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IEC 61937-3 Amd.1 Ed. 3.0 en:2020Amendment 1 - Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 3: Non-linear PCM bitstreams according to the AC-3 and enhanced AC-3 formatsAmendment by International Electrotechnical Commission, 09/22/2020
IEC 61937-3 Ed. 3.1 en:2020Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 3: Non-linear PCM bitstreams according to the AC-3 and enhanced AC-3 formats CONSOLIDATED EDITIONstandard by International Electrotechnical Commission, 09/22/2020
IEC 60747-17 Ed. 1.0 en:2020Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulationstandard by International Electrotechnical Commission, 09/21/2020
IEC 60747-17 Ed. 1.0 b:2020Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulationstandard by International Electrotechnical Commission, 09/21/2020
IEC 62977-2-2 Ed. 1.0 en:2020Electronic displays - Part 2-2: Measurements of optical characteristics - Ambient performancestandard by International Electrotechnical Commission, 09/21/2020
IEC 62793 Ed. 2.0 en:2020Protection against lightning - Thunderstorm warning systemsstandard by International Electrotechnical Commission, 09/21/2020
IEC 61966-12-1 Ed. 2.0 b:2020Multimedia systems and equipment - Colour measurement and management - Part 12-1: Metadata for identification of colour gamut (Gamut ID)standard by International Electrotechnical Commission, 09/21/2020
IEC 60601-2-35 Ed. 2.0 en:2020Medical electrical equipment - Particular requirements for the safety of blankets, pads and mattresses intended for heating in medical usestandard by International Electrotechnical Commission, 09/21/2020
IEC 60512-29-100 Ed. 1.0 b:2015Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29gstandard by International Electrotechnical Commission, 03/05/2015
IEC 62047-17 Ed. 1.0 b:2015Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin filmsstandard by International Electrotechnical Commission, 03/05/2015
IEC 62047-16 Ed. 1.0 b:2015Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methodsstandard by International Electrotechnical Commission, 03/05/2015
IEC 60050-192 Ed. 1.0 b:2015International Electrotechnical Vocabulary (IEV) - Part 192: Dependabilitystandard by International Electrotechnical Commission, 02/26/2015