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IEEE 256-1963IEEE Test Procedure for Semiconductor Diodesstandard by IEEE, 12/20/1963
IEEE 255-1963 [ Withdrawn ]IEEE Standard Letter Symbols for Semiconductor Devicesstandard by IEEE, 12/01/1963
IEEE 252-1963IEEE Proposed Procedure for Polyphase Induction Motors Having Liquid in the Magnetic Gapstandard by IEEE, 11/30/1963
IEEE 83-1963Test Procedure for Radial Power Factor Tests on Insulating Tapes in Paper-Insulated Power Cablestandard by IEEE, 11/20/1963
IEEE 84-1963IEEE Test Procedure for Determining Tensile Strength and Hardness of Lead Sheathsstandard by IEEE, 11/20/1963
IEEE 82-1963 [ Withdrawn ]IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductorsstandard by IEEE, 11/20/1963
IEEE 127-1963 [ Withdrawn ]IEEE Standard for Aerospace Equipment Voltage and Frequency Ratingsstandard by IEEE, 11/15/1963
IEEE 254-1963IEEE Standard Definitions of Parametric Device Termsstandard by IEEE, 11/15/1963
IEEE 251-1963IEEE Proposed Test Procedure for Direct Current Tachometer Generatorsstandard by IEEE, 10/31/1963
IEEE 22A-1962 [ Withdrawn ]IEEE Guide for the Application of Interrupter Switches to Switch Capacitance Loadsstandard by IEEE, 12/01/1962
IEEE 162-1963 [ Withdrawn ]IEEE Standard Definitions of Terms for Electronic Digital Computersstandard by IEEE, 11/30/1962
IEEE S-135IEEE/IPECEA Power Cable Ampacities - Copper Conductors - Aluminum Conductorsstandard by IEEE, 10/21/1962